Parallel Test Advantage | Reduce WIP, Labor, and Test Cost

CheckSum's Suite of Parallel Test Technologies Creates New Options

Not Just Faster Cycle Times

SMT Output Keeps Rising as Lines Get Faster and Panels Get Denser, Putting More Pressure on Test. When Test Can’t Keep Pace, Factories are Forced to Choose: Accept the Risk of WIP or Expanded Test Footprint, Both Have a Cost.

CheckSum’s Parallel Test Technologies Help Electronics Manufacturers Keep Pace with Faster SMT Lines, Denser Panels, and Rising Test Demand.

SMT Lines Are Faster, Increasing Panels per Hour
Panels Are Denser, Multiplying Boards per Hour Without Adding Lines
Traditional Test Scales Linearly, so the Gap Shows up as WIP, Added Shifts, or More Test Cells.

CheckSum's Parallel Test Changes the Math.

The SMT-to-Test Gap Doesn't Stay Hidden for Long

If You See these Signs on Your Floor, Test May be Falling Behind SMT Output:

SMT Factory Technician Tablet Inventory D

By Combining the Suite of Parallel Test Options Offered by CheckSum, Customers Are Able to:

Reduce Test Cell Footprint
Improve Test Coverage with More Testing, Earlier in the Process
Reduce Fixture and Operator Costs
Improve Quality

By Moving Selected End-of-Line Functional tests Earlier and Performing Them at the Panel Level, Manufacturers can Improve Coverage Earlier in the Process, While Reducing the Burden on End-of-Line Test, With Fewer Systems, Operators and Shifts.

Example: Two Beds - One Balanced Flow

ICT in Bed 1 / ISP and PFT CAN in Bed 2