Applications
- Loaded Circuit Assemblies
- Through-Hole and SMT Assemblies
- Single and Double-Sided Assemblie
- Individual or Panelized Printed Circuit Boards (PCBs)
- In-System Programming (ISP) with MultiWriter
Overview
Now you have a choice when it’s time to increase the capacity of your Agilent in-circuit test installation. The CheckSum Analyst fcs™ Fixture-Compatible In-Circuit Tester delivers the testing benefits at about half of what it costs to buy, deploy, use, and maintain an additional Agilent system.
Best of all, you preserve your sizable investment—often exceeding that of the tester itself—in Agilent 3070-style test fixtures. With the Analyst fcs you get:
- Complete non-digital vector in-circuit test coverage for today’s—and tomorrow’s—SMT technology boards
- Fully integrated point-for-point-compatible Agilent 3x7x fixture interface. No adapter required.
- Accepts 1-, 2- and 4-module 3070-style bed-of-nails test fixtures
- Can be equipped with up to 5184 test points
- Available Agilent Device Under Test (DUT) power supplies
- Reliable solid-state switching
- Numerous customizable options
- Software tools for Agilent test job data capture and processing
- Powerful SPC tools for debugging and real-time production monitoring
- Rugged simplicity that’s reliable and easy to maintain
Download Analyst fcs brochure 
Download Analyst fcs data sheet and specifications
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Programming
In-circuit test information (such as switching, guarding, test setups, and tolerances) from the original Agilent test job is captured and processed into an Analyst test program, ready for final validation by your test engineers—or by CheckSum’s Applications Support Group. The Program Import screen (shown below) illustrates the process:
Program import process steps are:
- Select project
- Import Board File
- Import Wirelist File
- Import Testplan File
- Generate Test Steps
- Learn Board
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System Capabilities
For component in-circuit testing, the Analyst system provides effective tools to find most faults. These measurements are made with signal injection/measurement, but without the UUT powered on--greatly simplifying test programming--and reducing iongoing application cost. Measurements are taken at high speeds using a solid-state multiplexing system.
Opens/Shorts
Analyst can test from each point to each other point to detect faults.
Open/short thresholds are typically in the 10 ohm range, but can be
programmed over the range of 2 ohms to 50K ohms. Continuity tests can
use 10mA, 1mA or 100µA source current.
Specified pairs of points can be designated as
"no-cares" to allow the most effective
diagnostics or to deal with points that are near
threshold values.
Resistance Measurements
Analyst provides the ability to measure from 0 ohms up to 19Mohms using various techniques to optimize the measurement effectiveness. You can choose between using a constant-current source (0.1µA to 10mA), a DC constant-voltage source (.02V to 2V full range), or AC complex-impedance measurements over the range of 100Hz - 1KHz. Resistance tests can be used with external sense (4-wire Kelvin measurements), and in conjunction with multi-point guarding to isolate individual components. Guard currents up to 100mA are available. Up to 16 distinct measurement and stimulus functions can be active during a single measurement.
Capacitance Measurements
Analyst provides the ability to measure from a few pF up to 20,000µF. You can choose between using a constant-current pulsed source (1mA to 10mA), or AC complex-impedance measurements over the range of 100Hz to 100KHz. Capacitance tests can be used with external sense (4-wire Kelvin measurements), and in conjunction with multi-point guarding to isolate individual components. Guard currents up to 100mA are available. Up to 16 distinct measurement and stimulus functions can be active during a single measurement.
Inductance Measurements
Analyst provides the ability to measure from 10µH up to 1000H. Measurements are made by using complex-impedance measurements with stimulus frequencies between 100Hz and 100KHz and full-range amplitudes of .02V to 2V. Inductance tests can be used with external sense (4-wire Kelvin measurements), and in conjunction with multi-point guarding to isolate individual components. Guard currents up to 100mA are available. Up to 16 distinct measurement and stimulus functions can be active during a single measurement.
Voltage Measurements
For UUTs that have batteries, DC amplitudes up to 10 volts can be measured. Fully differential measurements can be made up to ±8V from chassis ground.
Transistors
Transistors can be tested as two diode junctions, or tested for Beta while in-circuit. The Beta test can help determine proper insertion polarity for transistors that can be installed backwards, but with the base still in the middle. This type of fault can not typically be detected with diode testing of the junctions.
FETs
FETs can be tested for turn-on voltage. By sweeping a voltage into the gate while monitoring the Source/Drain impedance, the FET can be checked for proper orientation and operation.
Opto-Isolators
Opto-isolators can be tested by sourcing into the input leads while measuring the output impedance. By testing each device in the on and off state, high confidence is obtained.
Relays
Up to 24V with up to 100mA can be used to actuate relay coils. This allows testing of contacts in each state to ensure that the contacts are not shorted, and that the coil is operational.
Diodes
Diodes are tested by providing a constant current source (0.1µA to 100mA), then measuring the forward voltage drop, which is typically in the 0.6V to 0.8V range. This test ensures that the diode is installed, is in the proper orientation, and is not open or shorted.
Zener Diodes
Zeners are tested by providing a constant current source (0.1µA to 100mA), then measuring the forward voltage drop. Measurements up to 50V can be performed. This test ensures that the zener diode is installed, is in the proper orientation, and is not open or shorted. Zeners that cannot be brought to their full voltage due to current or voltage limiting can be tested as normal diodes or in some cases can be tested during the power-up stage.
LEDs
LEDs are tested like signal diodes, but normally have higher forward voltage drop. Special light-sensing probes can be added to customized test fixtures to detect brightness and color of LEDs and incandescent lamps.
Transformers
Transformers are typically tested for dc resistance of each coil to detect presence. Coils can also be tested for inductance, and a polarity test can be used to ensure that each coil is wired correctly. This can detect faults inherent to hand-loading of transformers with wire leads.
IC Presence and Orientation Testing
IC presence and orientation is verified by checking the semiconductor junction voltage of the protection diodes typically present between IC pins and the UUT power supplies. This mapping is self-programmed from a known-good UUT. This
test detects most faults such as shorted pins, open pins, or
mis-clocked or wrong ICs. In some cases, faults may not
be detected if the IC pins are bussed or devices of similar
pin-topology are interchanged.
IC Pin Connections
With the use of TestJet Technology, the Analyst can detect opens to IC pins, even though the pin is bussed to other ICs. This advanced technology (licensed to CheckSum by Agilent), uses a sophisticated software/hardware algorithm to measure the minute capacitance between the PCB and the IC for each pin. If a pin is open, the capacitance significantly decreases. This technology can be used for most non-power and ground lines on the ICs and on many connectors to ensure proper connection and/or connector presense.
Capacitor Polarity based on TestJet Technology
In some cases, constant-current and voltage measurements of a polarized capacitor can be used to detect incorrect polarity since the capacitor draws additional current as the voltage increases in the incorrect polarity. As a practical matter, this technique cannot be used in many cases during in-circuit testing because of voltage or parallel impedance limitations. In this case, the SMT option can be used to detect the polarity of most axial/SMT aluminum and tantalum capacitors up to about 200µF.
Boundary-Scan Option
The Analyst fcs can be configured with the optional Boundary-Scan Test.
This allows the System to be used with UUTs that have been designed
to accommodate boundary-scan, or have on-board devices that support
boundary-scan. In addition, boundary scan can be used by some programmable devices
to perform in-system programming and program verification.
Click here to see an overview of boundary-scan.
Click here to see a list of our boundary-scan partners and their test tools.
MultiWriter ISP Device Programming
The Analyst fcs can be equipped with the MultiWriter ISP programming and verification
capability to simultaneously program up to 384 ISP devices in-circuit.
Click here to see an overview of MultiWriter.
Click here to review the MultiWriter datasheet.
System Switching Topology
Analyst offers a flexible switching topology to minimize custom circuitry and to allow assemblies to be easily programmed.
The system uses a N x 16 solid-state analog bus that allows each
test point to be a measure source high, measure source low,
measure sense high, measure sense low, guard source, guard sense,
or DC/AC signal source. The solid-state matrix provides high-speed
and reliability for power-down testing, or for functional testing of
points that do not exceed ±12V referenced to the computer chassis.
Fixturing
The CheckSum Analyst fcs is specifically designed to accept 1-, 2- and 4-module 3070-style bed-of-nails test fixtures and the test program data. You preserve your sizable
investment in Agilent 3070-series test fixtures which can often exceed that
of the tester itself.
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Configuration
The Analyst fcs can be configured with:
- Analyst fcs chassis with 2 or 4 banks
- TR-10-EMS System Electronics with Test System Software for Windows XP
- Up to 28 of the MPX-3-200 200 Test Point Modules
- SMT-3 TestJet Technology Module and License
- TPCXICU20 Tower PC, Industrial 20-slot Chassis with USB2C
- IC20 Industrial 20-slot Expansion Chassis
- T-120-2P Printer
The Analyst fcs system can be configured with additional modules and other options that can expand the system:
- FUNC-2 Functional Test Electronic Module
- Agilent N6700B Power Supply and optional modules
If you need a different configuration, feel free to call us and discuss your application.
* TestJet Technology is protected under U.S. patent numbers 5,124,660 and 5,254,953.
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